Capturing Label Characteristics in VAEs
Published in ICLR 2021, 2021
@article{joy2020capturing,
title={Capturing Label Characteristics in VAEs},
author={Joy, Tom and Schmon, Sebastian and Torr, Philip H.S. and Siddharth, N and Rainforth, Tom},
journal={International Conference on Learning Representations},
year={2020}
}